Read Introduction to Advanced Systemonchip Test Design and Optimization

Introduction to Advanced Systemonchip Test Design and Optimization

Erik Larsson

4.9/5 (28395 ratings)

Description:Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at an immense clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective. Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and response), generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (P1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution. SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. The three partsof the book, test concepts, SOC design for test, and SOC test applications, covers in the first part an introduction to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan, while the second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process.We have made it easy for you to find a PDF Ebooks without any digging. And by having access to our ebooks online or by storing it on your computer, you have convenient answers with Introduction to Advanced Systemonchip Test Design and Optimization. To get started finding Introduction to Advanced Systemonchip Test Design and Optimization, you are right to find our website which has a comprehensive collection of manuals listed.
Our library is the biggest of these that have literally hundreds of thousands of different products represented.

Pages: 388

Format: PDF, EPUB & Kindle Edition

Publisher: Springer

Release: 2005

ISBN: 0387256245

Description: Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at an immense clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective. Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and response), generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (P1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution. SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. The three partsof the book, test concepts, SOC design for test, and SOC test applications, covers in the first part an introduction to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan, while the second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process.We have made it easy for you to find a PDF Ebooks without any digging. And by having access to our ebooks online or by storing it on your computer, you have convenient answers with Introduction to Advanced Systemonchip Test Design and Optimization. To get started finding Introduction to Advanced Systemonchip Test Design and Optimization, you are right to find our website which has a comprehensive collection of manuals listed.
Our library is the biggest of these that have literally hundreds of thousands of different products represented.

Special Offer | $0.00

Special Offer! | $0.00

Introduction to Advanced Systemonchip Test Design and Optimization

Introduction to Advanced Systemonchip Test Design and Optimization

More Books

Den tredje passageraren (Erik Larsson och My Englund #1)

Den tredje passageraren (Erik Larsson och My Englund #1)

Nationens fiende (Erik Larsson och My Englund #4)

Nationens fiende (Erik Larsson och My Englund #4)

Director Musices: Hugo Alfven, Wilhelm Stenhammar, Johann Christian Friedrich Haeffner, Jacob Axel Josephson, Eric Burman, Lars-Erik Larsson

Director Musices: Hugo Alfven, Wilhelm Stenhammar, Johann Christian Friedrich Haeffner, Jacob Axel Josephson, Eric Burman, Lars-Erik Larsson

Smugglaren: Erik Larsson och My Englund 2

Smugglaren: Erik Larsson och My Englund 2

Lars Erik Larsson Pastoral Suite Op.19 Full Score Custom Hardbound

Lars Erik Larsson Pastoral Suite Op.19 Full Score Custom Hardbound

Fortidens dæmoner

Fortidens dæmoner

Space-Time Block Coding for Wireless Communications

Space-Time Block Coding for Wireless Communications

Svenska Stadsplanerare: Sven Markelius, Gunnar Leche, Clas Larsson Fleming, Nicodemus Tessin D.Y., Yngve Larsson, Erik Dahlbergh, Herman Ygberg

Svenska Stadsplanerare: Sven Markelius, Gunnar Leche, Clas Larsson Fleming, Nicodemus Tessin D.Y., Yngve Larsson, Erik Dahlbergh, Herman Ygberg

Space-Time Block Coding for Wireless Communications by Erik G. Larsson (2003-06-16)

Space-Time Block Coding for Wireless Communications by Erik G. Larsson (2003-06-16)